Development and manufacture of analytical equipment
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MetExpert:-T X-Ray Fluorescence Analyzer

MetExpert-T x-ray fluorescence analyzers are designed to measure the mass fraction of chemical elements in metals and alloys, powders, liquids, oils, ores, soils, water, plastics, jewelry and has the ability to measure the thickness of coating.

It identifies up to 81 chemical elements from sodium Na (Z=11) to curium Cm (Z=96).

ADVANTAGES AND FEATURES:
  • A large modern color LCD display allows you to work with gloves without using a stylus.
  • The updated tapered tip allows you to reach any hard-to-reach places, welds and complex structures.
  • Ability to analyze surfaces heated up to 500 °C (optional).
  • The proximity of the infrared sample sensor to the measuring window provides an easy analysis of small objects (wire chips, etc.).
  • Specialized professional Linux-based software provides reliable and fast operation without failures and freezes.

SCOPE OF APPLICATION:

  • Incoming inspection of metals 
  • Control of precious metals 
  • Scrap sorting
  • Mass analysis of rocks and ores 
  • Express determination of the composition of ore dressing products 
  • Determination of rare earth elements 
  • Analysis of impurities in metals 
  • Determination of alloy grades 
  • Detection of deviations in processes by the composition of intermediate product

Directions

Documents

Specifications

Feature
Value
Chemical elements atomic numbers range: Z=11(Na)…96(Cm)
Relative average square deviation of the output signal on the K-se ries Fe lines* not over 2%
Sensitivity on K-series Fe lines* at least 200 pulse/(c·mkA·%)
Measuring range of elements mass fraction ** 0.001 to 100 %
Limits of permissible relative measurement error of elements mass fraction** in the measurement sub-ranges:
- 0.001% to 0.1% incl. ± 25 %
- over 0.1% to 1% incl. ± 20 %
- over 1% to 10% incl. ± 5 %
- over 10% to 100% incl. ± 3 %
Coating thickness measuring range*** 2 to 15 microns
Limits of permissible relative measurement error of coating thickness***, in the measurement sub-ranges:
- 2 to 15 microns incl.
±15 %
Range of coating thickness readings 0.001 to 110 microns
Operating mode establishment time no more than 45 sec
Measurement time (selected by the operator depending on the type of sample or the analyzed area) 3 to 240 sec
Continuous battery life with a standard battery pack at least 12 h
Equivalent dose rate under normal operating conditions of the analyzer,
at any accessible point at a distance of 0.1 meters from the surface of the analyzer
not more than 1 mcSv/h
Operation conditions:
- air temperature -35 to +50° C
- relative humidity not more than 98 %
Protection class according IP65
Overall dimensions (LxWxH) 227x93x270 mm
Weight not more than 2 kg
The presence of a safety system in the device - Optical sample presence sensor;
- Software control of radiation intensity
Detector type Silicon drift SDD
Detector resolution 127 eV
Telecommunications Interfaces BlueTooth, USB, Wi-Fi (optional)
Protection of the measuring window A brass plate that does not require consumables
Case material Impact-resistant plastic
Format of providing measurement results Creation of reports based on the user’s template in PDF, RTF, CSV formats

* the value is normalized for iron in a standard sample of the mass fraction of iron in a solid matrix with a mass fraction from 0.90% to 1.10%.
** values are normalized for elements in standard samples of iron-based alloys.
*** values are normalized for analyzers with a coating thickness measurement mode; values are normalized when measuring standard samples of nickel coating thickness on duralumin and permalloy nanocoating on silicon.

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